The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jan. 28, 2014
Applicants:

Justin P. Haldar, Los Angeles, CA (US);

Richard M. Leahy, El Segundo, CA (US);

Inventors:

Justin P. Haldar, Los Angeles, CA (US);

Richard M. Leahy, El Segundo, CA (US);

Assignee:

University of Southern California, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/56341 (2013.01);
Abstract

Samples of a Fourier transform of a signal may be received that are distributed in a generally spherically-shaped pattern on a surface of at least one sphere. The samples may be assembled to form a profile function having a domain that is a surface of at least one sphere. Information indicative of at least one property of the signal may be determined by applying a spherical linear transform to the profile function. The spherical linear transform may use more than just an equator of the profile function for each of multiple orientations.


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