The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Jan. 29, 2015
Applicant:
Emscan Corporation, Calgary, CA;
Inventors:
Ruska Patton, Calgary, CA;
Yiping Zhou, Calgary, CA;
Gil Montag, Calgary, CA;
Robert Xue, Calgary, CA;
Assignee:
EMSCAN CORPORATION, Calgary, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 29/08 (2006.01); G01R 23/16 (2006.01); G01R 31/00 (2006.01); G01R 1/07 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0814 (2013.01); G01R 1/073 (2013.01); G01R 23/16 (2013.01); G01R 29/0878 (2013.01); G01R 31/00 (2013.01); G01R 31/001 (2013.01); G01R 1/07 (2013.01); G01R 29/08 (2013.01);
Abstract
A scanner system and method operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT) are provided. The electromagnetic field level radiated by the DUT is measured with a probe array comprising a plurality of spatially separated switched probes, an analyzer, and a computer. An actuator changes the relative position of the probe array to the DUT by a distance less than or equal to the separation distance between the probes, and the electromagnetic field level is measured and stored again.