The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Oct. 14, 2015
Texas Instruments Incorporated, Dallas, TX (US);
Dale Vincent Ohmart, Sugar Land, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A test system for performing a plurality of tests on a plurality of devices includes a tester having a plurality of tester pins and at least one socket, wherein the plurality of devices are received in the at least one socket. The test system further includes a plurality of multiplexers, wherein each of the multiplexers has an input coupled to one of the plurality of tester pins and each of the multiplexers has outputs coupled to individual device pins of the devices. The tester is configurable to perform a first test on a first plurality of devices and a second test on a second plurality of devices without disconnecting the devices from the at least one socket.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile