The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Nov. 04, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Eun Jeong Jang, Suwon-si, KR;
Sung Hwa Lee, Anyang-si, KR;
Jung Tae Lee, Suwon-si, KR;
Jeong Min Jo, Suwon-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); B01L 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00871 (2013.01); B01L 7/00 (2013.01); G01N 35/00069 (2013.01); G01N 35/0092 (2013.01); G01N 35/00712 (2013.01); B01L 2200/147 (2013.01); B01L 2300/027 (2013.01); G01N 2035/0091 (2013.01); G01N 2035/00346 (2013.01); G01N 2035/00435 (2013.01); G01N 2035/00455 (2013.01); G01N 2035/00851 (2013.01);
Abstract
A test apparatus and a method for controlling the same are provided. The test apparatus may receive information about a reaction device, information about a storage environment, and external environment information from a storage storing a sample and a sensor sensing the external environment of the test apparatus. The test apparatus may perform a variety of control actions for testing the sample based on a temperature of and around the reaction device, resulting in increased reliability of the test result.