The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Mar. 03, 2015
Atlas Sensors, Llc, Sunnyvale, CA (US);
Philip J. Stephanou, Mountain View, CA (US);
Atlas Sensors, LLC, Sunnyvale, CA (US);
Abstract
A system for determining a material property is disclosed. In some embodiments, a method for determining a material property comprises receiving a set of material responses corresponding to a set of ultrasonic excitations. The set of material responses are determined using measurements to determine a peak response for each of the set of ultrasonic excitations. In some embodiments, a device for making non-destructive in-situ measurements of the elastic yield strength of a sample (e.g., a steel plate or pipeline wall) is disclosed. The device determines the yield strength of a specimen based on transducing ultrasonic waves within the medium and correlating quantifiable characteristics of the resulting frequency response to the intrinsic elastic nonlinearity of the material. In various embodiments, the device includes one or more electrodes, an acoustic termination, a horn, a flange, a collar, power electronics, signal processors, a memory, a user interface, or any other appropriate device component.