The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Dec. 03, 2015
Advacam S.r.o., Praha, CZ;
Jan Sohar, Hýskov, CZ;
ADVACAM S.R.O., Prague, CZ;
Abstract
The invention describes a method and a device () for executing a method of X-ray nano-radiography and nanotomography using a scanning electron microscope () consisting of the focus of an electron beam () from an electron microscope () onto one point of the surface of a scanned sample (), the emission of bremsstrahlung and fluorescent radiation () from the focal point of the impact of the electron beam (), the sensing of the scanned sample (), and recording an image of the structure of the scanned sample () based on the change of intensities of the bremsstrahlung and fluorescent radiation () by the imaging detector () arranged behind the sample ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile