The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Feb. 19, 2013
Applicant:
Leica Biosystems Nussloch Gmbh, Nussloch, DE;
Inventors:
Assignee:
Leica Biosystems Nussloch GmbH, Nussloch, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/36 (2006.01); G02B 21/34 (2006.01); G06T 7/00 (2017.01); G01N 1/28 (2006.01); G01N 1/31 (2006.01); G06K 9/00 (2006.01); G06K 9/03 (2006.01); G02B 21/10 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 1/36 (2013.01); G01N 1/2813 (2013.01); G01N 1/312 (2013.01); G02B 21/34 (2013.01); G06K 9/00127 (2013.01); G06K 9/036 (2013.01); G06T 7/0012 (2013.01); G06T 7/0014 (2013.01); G02B 21/10 (2013.01); G02B 21/365 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30024 (2013.01);
Abstract
The invention relates to a method in the preparation of samples for microscopic examination onto which a coverslip is applied. The method is notable for the fact that the coverslipping quality is checked automatically and at least partly optically. The invention further relates to an apparatus for carrying out the method, and to an apparatus for checking the coverslipping quality of samples onto which a coverslip is applied.