The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Oct. 23, 2014
Applicant:

Withtech Inc, Daejeon, KR;

Inventors:

Seoung-Kyo Yoo, Daejeon, KR;

Eung Sun Lee, Daejeon, KR;

Hyun Wook Lee, Daejeon, KR;

Assignee:

WITHTECH INC, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/26 (2006.01); G01N 15/06 (2006.01); G01N 33/00 (2006.01); G01N 35/08 (2006.01); G01N 15/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 1/26 (2013.01); G01N 15/06 (2013.01); G01N 33/0011 (2013.01); G01N 35/08 (2013.01); G01N 35/1097 (2013.01); G01N 35/1095 (2013.01); G01N 2015/0046 (2013.01);
Abstract

Provided are a multi sampling port monitoring apparatus for measuring a pollution level in a predetermined space and a monitoring method using the same. More particularly, provided are a multi sampling port monitoring apparatus capable of effectively monitoring a pollution level in a wide space by including a plurality of sampling ports so that air is sucked at several points in a space to be measured, measuring an average pollution level of the air sucked from the plurality of sampling ports, and allowing pollution levels of the air sucked from the sampling ports to be individually measured in the case in which the average pollution level is out of a predetermined range, and a monitoring method using the same.


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