The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Dec. 02, 2014
Applicant:

Takeshi Nagahisa, Osaka, JP;

Inventor:

Takeshi Nagahisa, Osaka, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01K 1/02 (2006.01); G01J 5/10 (2006.01); G01J 5/06 (2006.01);
U.S. Cl.
CPC ...
G01J 5/10 (2013.01); G01J 5/0022 (2013.01); G01J 5/0025 (2013.01); G01J 5/06 (2013.01); G01J 2005/0048 (2013.01); G01J 2005/068 (2013.01);
Abstract

A semiconductor integrated circuit includes an acquisition unit configured to acquire a value outputted from an infrared sensor in response to an infrared ray received from an object, and a value outputted from a temperature sensor as a function of measured temperature of the infrared sensor; a second-temperature identification circuit configured to identify a second temperature which is a temperature of the object when the temperature of the infrared sensor corresponding to a measured value which is the output value of the infrared sensor, is the first temperature, by referring to the correspondence; a third-temperature identification circuit configured to identify a third temperature which is the temperature of the infrared sensor in outputting the measured value; and a calculation circuit configured to calculate a fourth temperature which is a temperature of the object on the basis of the first temperature, the second temperature, and the third temperature.


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