The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
May. 14, 2015
Texas Instruments Incorporated, Dallas, TX (US);
Amardeep Sathyanarayana, Austin, TX (US);
Nitish Murthy, Allen, TX (US);
Sourabh Ravindran, Dallas, TX (US);
Brian Paul Burk, Dallas, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method and apparatus for determining properties of at least one of a surface or materials adjacent to a portable device. The method includes windowing a segment of the received signal to remove an edge transients, computing the FFT power spectral density of the signal, determining a peak in the spectral energy at a frequency, finding local peaks by determining the difference in the signal amplitude is relation to a pre-determined threshold, and computing harmonic energy according to the local peaks and the difference and determining at least one property of the surface or material.