The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Jun. 04, 2014
National Instruments Corporation, Austin, TX (US);
Christopher F. Graf, Liberty Hill, TX (US);
Ryan P. Verret, Austin, TX (US);
Joseph H. DiGiovanni, Austin, TX (US);
Dustyn K. Blasig, Pflugerville, TX (US);
Jeronimo Mota, Austin, TX (US);
Kunal H. Patel, Houston, TX (US);
Duncan G. Hudson, III, Cedar Park, TX (US);
Brian K. Odom, Georgetown, TX (US);
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
System and method for extending programmable device functionality while preserving functionality of the device driver and driver IP. User input may be received specifying functionality of custom IP for a programmable measurement device with standard driver IP. The custom IP may be generated accordingly, and may be deployable to the programmable measurement device. During operation the custom IP may communicate directly with the standard driver IP and may provide custom functionality of the programmable measurement device while preserving functionality of the standard driver IP on the programmable measurement device and the standard device driver.