The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Aug. 28, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Suk June Yoon, Seoul, KR;
Kyung Shik Roh, Seongnam-si, KR;
No San Kwak, Suwon-si, KR;
Shin Kim, Hwaseong-si, KR;
Ji Min Kim, Seoul, KR;
Soon Yong Park, Bucheon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
An optical scanning probe and an apparatus to generate three-dimensional (3D) data using the same are provided. The apparatus to generate 3D data includes an optical scanning probe that scans light generated from a light emitter over an object to be measured, a distance calculation processor that calculates a distance between the optical scanning probe and the object to be measured, based on the light scanned over the object to be measured and light reflected from the object to be measured; and a depth image generation processor that generates 3D data based on a scanning direction of the optical scanning probe and the distance between the optical scanning probe and the object to be measured.