The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Dec. 02, 2016
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Ehsan Dehghan Niri, Schenectady, NY (US);

Thomas James Batzinger, Burnt Hills, NY (US);

Gregory Lee Hovis, Martinez, GA (US);

Kevin Luo, Schenectady, NY (US);

Christopher Joseph Lochner, Natick, MA (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01); G01B 11/16 (2006.01); G01M 15/14 (2006.01); G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/16 (2013.01); G01M 15/14 (2013.01); F05B 2270/808 (2013.01); G01M 5/00 (2013.01);
Abstract

A system and related methods for evaluating a component using a reference feature and a replicate of the reference feature. The component has an exterior surface with a reference feature thereon. The method includes determining an initial condition of the reference feature, subjecting the component to at least one duty cycle after determining the initial condition, determining a subsequent condition of the reference feature after the at least one duty cycle while the component is in a service position, and forming a replicate of the reference feature while the reference feature is in one of the initial condition or the subsequent condition. One of the initial condition or the subsequent condition may be determined based on the replicate of the reference feature.


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