The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

May. 11, 2015
Applicant:

Caterpillar Inc., Peoria, IL (US);

Inventors:

Marion Billingsley Grant, Jr., Princeville, IL (US);

Richard Griffith Marsh, Edwards, IL (US);

Assignee:

Caterpillar Inc., Peoria, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 5/20 (2006.01);
U.S. Cl.
CPC ...
G01B 5/008 (2013.01); G01B 5/202 (2013.01);
Abstract

A system is disclosed for measuring a feature of a component. The system may have a probe with a tip, and a sensing element configured to generate signals associated with a proximity of the tip to the feature. The system may also have an actuator configured to move the probe relative to the component, and a controller in communication with the sensing element and the actuator. The controller may be configured to generate a deviation report based on the signals, and to filter information from the deviation report according to wavelength into a plurality of deviation categories corresponding to specification requirements of the component. The plurality of deviation categories may include at least a waviness category. The controller may also be configured to determine a change to a process used to fabricate the component based on the information from the deviation report filtered into the waviness category.


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