The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Jul. 23, 2015
Applicant:
Elwha Llc, Bellevue, WA (US);
Inventors:
Roderick A. Hyde, Redmond, WA (US);
John Marshall, Farnborough, GB;
Clarence T. Tegreene, Mercer Island, WA (US);
Roberto Zaldivar, Mendoza, AR;
Roger Zaldivar, Mendoza, AR;
Assignee:
ELWHA LLC, Bellevue, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61F 2/16 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61F 2/1627 (2013.01); A61B 5/0031 (2013.01); A61F 2250/0002 (2013.01);
Abstract
Embodiments disclosed herein are directed to intraocular lens systems having a plurality of materials therein, with at least some of the materials having a diffraction pattern therein and an electrically-modifiable index of refraction collectively configured to selectively alter the focal length of the intraocular lens system. Methods of modifying a focal length of an intraocular lens system are also disclosed.