The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Oct. 10, 2012
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Paul F. Stetson, Piedmont, CA (US);
Mary K. Durbin, San Francisco, CA (US);
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Abstract
Systems and methods for improving the assessment of disruption or abnormalities to retinal layers are presented. The disruptions are detected by analyzing at least one segmented boundary of optical coherence tomography data. Several different types of analysis can be used alone or in combination to make an assessment of the level of disruption to the particular boundary or layer defined by the boundary. The results can be presented as an end face image and quantified to report an amount of disruption. In one embodiment, a method for determining the disruption to the photoreceptor outer segment is described.