The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Jun. 24, 2015
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shigeki Shinoda, Tokyo, JP;

Shohei Kinoshita, Tokyo, JP;

Yasuhiro Sasaki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H03M 1/10 (2006.01); G01R 15/08 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01); G01R 15/08 (2013.01); G01R 23/16 (2013.01); H03M 1/12 (2013.01);
Abstract

To provide a measuring device wherein a measurement range corresponding to a wave shape to be measured can be set with a simple configuration. A measuring device () has: a measuring unit that measures changes of indexes with time, said indexes relating to an object event; a conversion unit that converts a measurement value measured by means of the measuring unit into a predetermined format within a previously set measurement range; and a control unit that controls the measurement range. The control unit changes the measurement range in the cases where a conversion value obtained by converting the measurement value by means of the conversion unit satisfies predetermined conditions in a predetermined period.


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