The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Aug. 02, 2016
Applicants:

Joled Inc., Tokyo, JP;

Japan Display Inc., Tokyo, JP;

Inventor:

Toshiaki Onimaru, Tokyo, JP;

Assignees:

JOLED INC., Tokyo, JP;

JAPAN DISPLAY INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/08 (2006.01); H01L 27/32 (2006.01); H01L 51/56 (2006.01); H01L 51/00 (2006.01); H01L 51/50 (2006.01);
U.S. Cl.
CPC ...
H01L 27/3246 (2013.01); H01L 27/3244 (2013.01); H01L 51/0005 (2013.01); H01L 51/504 (2013.01); H01L 51/5012 (2013.01); H01L 51/56 (2013.01); H01L 2227/323 (2013.01); H01L 2251/568 (2013.01);
Abstract

A bank repair method in a manufacturing process of an organic EL display device including first and second banks forming a matrix over a substrate. When a defect portion of a first bank is detected, in each of adjacent concave spaces between which the first bank having the defect portion is located, a candidate forming position is set and a dam portion partitioning the concave space into a first space in a vicinity of the defect portion and a second space outside the vicinity of the defect portion is formed. When denoting sub-pixel region surface area as H and denoting a surface area of a region of a candidate first space overlapping with a sub-pixel region as I, the dam portion is formed at the candidate forming position according to a first forming method when I<α×H is fulfilled, where 0.05<α<0.9.


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