The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Feb. 28, 2015
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventors:

Viorica Lopez-Avila, Santa Clara, CA (US);

Mark Denning, Santa Clara, CA (US);

Mehrnoosh Vahidpour, Santa Clara, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); H01J 49/04 (2006.01); H01J 49/00 (2006.01); H01J 49/16 (2006.01); H05H 1/46 (2006.01); G01N 21/71 (2006.01); G01N 30/95 (2006.01); H01J 27/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/102 (2013.01); G01N 21/714 (2013.01); H01J 49/0031 (2013.01); H01J 49/0409 (2013.01); H01J 49/049 (2013.01); H01J 49/105 (2013.01); H01J 49/161 (2013.01); H05H 1/46 (2013.01); G01N 30/95 (2013.01); H01J 27/16 (2013.01);
Abstract

An ion source includes a plasma generator for supplying plasma at an ionization region proximate to a sample surface. The plasma generator applies energy that may be utilized for desorbing analytes from the sample surface as well as for generating plasma by which analytes are excited or ionized. Desorption and ionization/excitation may be controlled as individual modes. The ion source may be interfaced with an ion-based or optical-based spectrometer. A sample support may be provided, which may be capable of performing analytical separation.


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