The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
Oct. 30, 2013
The Chancellor Masters and Scholars of the University of Oxford, Oxfordshire, GB;
Ashley Alan Napier, Oxford, GB;
Paul Michael Newman, Oxford, GB;
The Chancellor Masters and Scholars of the University of Oxford, Oxfordshire, GB;
Abstract
A method and system for determining extrinsic calibration parameters for at least one pair of sensing devices mounted on transportable apparatus obtains () image data () representing images captured by an image generating sensing device () of the pair at a series of poses during motion through an environment () by transportable apparatus (). The method obtains () data () representing a 3D point cloud based on data produced by a 2D LIDAR sensing device () of the pair. The method selects () an image captured by the image at a particular pose. The method generates () a laser reflectance image based on a portion of the point cloud corresponding to the pose. The method computes () a metric measuring alignment between the selected image and the corresponding laser reflectance image and uses () the metric to determine extrinsic calibration parameters for at least one of the sensing devices.