The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Aug. 11, 2016
Applicant:

Flir Systems, Inc., Wilsonville, OR (US);

Inventor:

Scott McNally, Santa Barbara, CA (US);

Assignee:

FLIR Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G06T 7/60 (2017.01); G06T 7/00 (2017.01); G06T 3/40 (2006.01); H04N 5/217 (2011.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 3/403 (2013.01); G06T 7/0085 (2013.01); H04N 5/2254 (2013.01); H04N 5/2175 (2013.01);
Abstract

Techniques, methods, and systems for image processing may be provided. The image processing may be provided for upsampling and interpolating images. The upsampling and interpolating may include interpolating the image through at least an edge weight and a spatial weight. In various embodiments, the edge weight and/or the spatial weight may be calculated with a kernel. The kernel may be a kernel with a two dimensional (2D) distribution such as a Gaussian kernel, a Laplacian kernel, or another such statistically based kernel. The image processing may also include refining the upsampled and interpolated image through a refinement weight calculation and/or through back projection.


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