The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Jan. 14, 2016
Applicants:

Canon Kabushiki Kaisha, Tokyo, JP;

University of Rochester, Rochester, NY (US);

Inventors:

Koji Nozato, Rochester, NY (US);

Kenichi Saito, Yokohama, JP;

Qiang Yang, Rochester, NY (US);

Assignees:

Canon Kabushiki Kaisha, Tokyo, JP;

University of Rochester, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/20 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); A61B 3/0025 (2013.01); A61B 3/14 (2013.01); G06K 9/0061 (2013.01); G06K 9/00335 (2013.01); G06K 9/6201 (2013.01); G06T 7/004 (2013.01); G06T 7/20 (2013.01); G06T 2207/30041 (2013.01); G06T 2207/30196 (2013.01);
Abstract

A method, controller, and non-transitory medium for obtaining images of a moving subject. Estimating changes in position of the subject based on the images. Calculating a quality metric of the estimation of the change. Comparing the quality metric to a threshold. In a first case in which the quality metric is less than the threshold, adjusting position of the scanning area based on the estimated change in position. In a second case in which the quality metric is not less than the threshold, obtaining a new second image.


Find Patent Forward Citations

Loading…