The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Jan. 15, 2016
Applicant:

Toshiba Medical Systems Corporation, Otawara-Shi, JP;

Inventors:

Zhou Yu, Wilmette, IL (US);

Yan Liu, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06K 9/52 (2006.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/00 (2013.01); G06K 9/52 (2013.01); G06T 7/0012 (2013.01); G06T 11/008 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10116 (2013.01);
Abstract

A method and apparatus is provided to denoise material-decomposition data generated using projection data from a spectral computed tomography scanner. A whitening transform is used to transform the material-decomposition data into uncorrelated components and perform denoising on the uncorrelated components. Using different denoising parameters for the various uncorrelated components, a flattening can be achieved for the standard deviation of the noise as a function of X-ray energy, which can be determined using mono-energetic images derived from the material-decomposition data. The whitening transformation and the denoising can be applied the material-decomposition sinograms and/or to material-decomposition images reconstructed from the material-decomposition sinograms.


Find Patent Forward Citations

Loading…