The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
Jul. 31, 2015
Keiji Ohmura, Kanagawa, JP;
Aiko Ohtsuka, Kanagawa, JP;
Kazuya Takahashi, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An abnormality detection apparatus, an abnormality detection method, and an abnormality detection program are provided. Each of the abnormality detection apparatus, an abnormality detection method, and an abnormality detection program extracts a target image to be monitored and a reference image, respectively, from target video to be monitored, detects an abnormality based on a difference between the target image to be monitored and the reference image, and displays an image indicating a difference between the target image to be monitored and the reference image on a monitor. Moreover, an abnormality detection system is provided including the abnormality detection apparatus, a video that captures an image of a target to be monitored, and a monitor.