The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
Nov. 18, 2016
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Noa Sumida, Utsunomiya, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/043 (2006.01); H04N 1/00 (2006.01); H04N 1/028 (2006.01); H04N 1/29 (2006.01);
U.S. Cl.
CPC ...
G03G 15/043 (2013.01); H04N 1/00816 (2013.01); H04N 1/0283 (2013.01); H04N 1/29 (2013.01);
Abstract
An optical scanning apparatus includes a light source, a deflector configured to deflect a light flux from this light source to scan a surface to be scanned in a main-scanning direction, an incident optical system configured to guide the light flux from the light source to a deflection surface of the deflector, and an imaging optical system configured to guide the light flux deflected by the deflector to the surface to be scanned. The optical scanning apparatus satisfies the following conditions: 0.5<|β|<2.2, 3.0<|β|<10.0, and 0.2<<0.4.