The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Apr. 11, 2016
Applicant:

Samsung Display Co., Ltd, Yongin, Gyeonggi-Do, KR;

Inventors:

Dong-Gyu Kim, Yongin-si, KR;

Seung-Hwan Moon, Yongin-si, KR;

Yong-Soon Lee, Cheonan-si, KR;

Nam-Soo Kang, Ansan-si, KR;

Haeng-Won Park, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/14 (2006.01); H01L 29/04 (2006.01); H01L 29/15 (2006.01); H01L 31/036 (2006.01); G02F 1/1345 (2006.01); G02F 1/1339 (2006.01); G02F 1/1362 (2006.01); H01L 27/12 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
G02F 1/13454 (2013.01); G02F 1/1339 (2013.01); G02F 1/136286 (2013.01); H01L 27/124 (2013.01); H01L 27/1222 (2013.01); H01L 27/1255 (2013.01); H01L 29/78669 (2013.01); H01L 29/78678 (2013.01); G02F 1/1345 (2013.01); G02F 2001/13629 (2013.01);
Abstract

Gate-driving circuitry of a thin film transistor array panel is formed on the same plane as a display area of the transistor array panel. The gate-driving circuitry includes driving circuitry and signal lines having apertures. Thus, a sufficient amount of light, even though illuminated from the thin film transistor array panel side, can reach a photosetting sealant overlapping at least in part the gate-driving circuitry. The thin film transistor array panel and the counter panel are put together air-tight and moisture-tight. Consequently, the gate-driving circuitry can avoid corrosion by moisture introduced from outside. Gate-driving circuitry malfunctions can also be reduced.


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