The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
Aug. 04, 2015
Lensvector Inc., Sunnyvale, CA (US);
Bahram Afshari, Los Altos, CA (US);
Karen Asatryan, Quebec, CA;
Peter P Clark, Boxborough, MA (US);
Tigran Galstian, Quebec, CA;
Michael J. Nystrom, San Jose, CA (US);
Vladimir Presniakov, Quebec, CA;
Sergei Yakovenko, Pleasanton, CA (US);
Armen Zohrabyan, Quebec, CA;
LENSVECTOR INC., Sunnyvale, CA (US);
Abstract
Methods and apparatus for testing operation of a single or multiple tunable active optical device(s) operated by one or more driving electrodes are described. Test methods and apparatus are provided for device testing without necessarily requiring direct physical contact with the driving electrodes. Testing subjects devices to incident light along an optical path and to an external electric field applied to the device producing a dipolar charge distribution within the electrodes, causing the device to operate. The effect of device operation on incident light is optically sensed. The sensed effect is analyzed to identify device defects. Test methods and apparatus are provided for testing multiple unsingulated devices during fabrication employing a strip contact structure having contact strips connected to multiple devices and extending to wafer edges, such that singulating devices leaves portions of the strip contact structure exposed on device dice edges providing electrical contacts in use.