The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
May. 07, 2014
Applicant:
Forschungszentrum Mikroskopie (Fzm), Luciaoptics Gemeinnützige UG, Karlsruhe, DE;
Inventors:
Gerrit Best, Koblenz, DE;
Christoph Cremer, Heidelberg, DE;
Sabrina Rossberger, Heidelberg, DE;
Stefan Dithmar, Dossenheim, DE;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/16 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G01N 21/6458 (2013.01); G02B 21/0076 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); G02B 27/58 (2013.01); G01N 21/6445 (2013.01); G01N 2201/0675 (2013.01);
Abstract
A fluorescence microscope for obtaining super-resolution images of a sample labeled with at least one fluorescent label by combining localization microscopy and structured illumination microscopy is provided. The fluorescence microscope includes one or more light sources, an illumination system having a structured illumination path for illuminating the sample with structured illumination light and a localization illumination path for illuminating the sample with localization illumination light.