The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
Dec. 29, 2014
Applicant:
Avery Dennison Corporation, Mentor, OH (US);
Inventors:
Adrian N. Farr, Essex, GB;
Ian James Forster, Essex, GB;
Assignee:
AVERY DENNISON RETAIL INFORMATION SERVICES, LLC, Mentor, OH (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01); G01R 31/2822 (2013.01); G01R 27/2605 (2013.01);
Abstract
A system for measuring RFID strap characteristics by coupling through a dielectric. The system can include a meter, test pads, springs, and wiring. Test pads may contact a substrate opposite of the RFID strap, and the coupling capacitance through the dielectric substrate may be utilized to calculate the strap capacitance. Similarly, other electrical properties of an RFID strap or other RFID assembly may be measured by coupling through a dielectric.