The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
Nov. 12, 2015
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Joseph Milton Yehle, Dallas, TX (US);
James Henry McGee, Jr., Rowlett, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/28 (2006.01); G01R 31/30 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 31/3004 (2013.01); G01R 1/0408 (2013.01);
Abstract
Surge testing systems and methods to surge test a device under test (DUT) in which a host computer controls a pulse generator and an oscilloscope to automatically apply a high voltage pulse from the pulse generator through a current limiter to the DUT, the oscilloscope provides one or more current or voltage waveforms representing a voltage or current associated with the DUT and/or the pulse generator, and the host computer determines a pass or fail condition of the DUT for the applied high voltage pulse according to the waveform or waveforms.