The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Mar. 15, 2013
Applicant:

Becton Dickinson and Company, Franklin Lakes, NJ (US);

Inventors:

Kristin Weidemaier, Raleigh, NC (US);

Robert L. Campbell, Bullock, NC (US);

Erin Gooch Carruthers, Cary, NC (US);

Adam C. Curry, Raleigh, NC (US);

Kevin G. Dolan, Holly Springs, NC (US);

Andrea Liebmann-Vinson, Wake Forest, NC (US);

Wendy Dale Woodley, Cary, NC (US);

Melody M. H. Kuroda, Durham, NC (US);

Eric A. Fallows, Apex, NC (US);

Miroslaw Bartkowiak, Raleigh, NC (US);

Scott N. Danhof, Plain City, OH (US);

Gregory S. Kramer, Hilliard, OH (US);

Thomas D. Haubert, Columbus, OH (US);

Michael L. Marshall, Lewis Center, OH (US);

James A. Prescott, Columbus, OH (US);

Randy J. Somerville, Columbus, OH (US);

M. Scott Ulrich, Columbus, OH (US);

David S. Sebba, Cary, NC (US);

Assignee:

BECTON, DICKINSON AND COMPANY, Franklin Lakes, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); G01N 33/543 (2006.01); G01N 33/569 (2006.01); C12M 1/00 (2006.01); C12M 1/26 (2006.01); C12M 1/24 (2006.01); G01N 35/00 (2006.01); B03C 1/01 (2006.01); B03C 1/28 (2006.01); B01L 3/02 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54333 (2013.01); B01L 3/0217 (2013.01); B01L 3/502 (2013.01); B01L 3/50825 (2013.01); B03C 1/01 (2013.01); B03C 1/288 (2013.01); C12M 23/08 (2013.01); C12M 23/22 (2013.01); C12M 23/38 (2013.01); C12M 33/04 (2013.01); C12M 41/14 (2013.01); C12M 41/36 (2013.01); G01N 33/56911 (2013.01); G01N 35/0098 (2013.01); B01L 2200/026 (2013.01); B01L 2200/0605 (2013.01); B01L 2200/10 (2013.01); B03C 2201/26 (2013.01);
Abstract

Provided herein are methods, systems, and devices for detecting and/or identifying one or more specific microorganisms in a culture sample. Indicator particles, such as surface enhanced Raman spectroscopy (SERS)-active nanoparticles, each having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest, can form a complex with specific microorganisms in the culture sample. Further, agitating magnetic capture particles also having associated therewith one or more specific binding members having an affinity for the one or more microorganisms of interest can be used to capture the microorganism-indicator particle complex and concentrate the complex in a localized area of an assay vessel for subsequent detection and identification. The complex can be dispersed, pelleted, and redispersed so that the culture sample can be retested a number of times during incubation so as to allow for real-time monitoring of the culture sample.


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