The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Nov. 05, 2015
Applicant:

Sam Houston State University, Huntsville, TX (US);

Inventor:

Darren L. Williams, Huntsville, TX (US);

Assignee:

Sam Houston State University, Huntsville, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/22 (2006.01); H04N 7/18 (2006.01); H04N 5/232 (2006.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 2201/0221 (2013.01);
Abstract

In some embodiments, a system and/or method may include assessing surface cleanliness. In some embodiments, the system may include a dispensing device. The dispensing device may dispense, during use, a measured amount of liquid on a surface forming a drop. In some embodiments, the system may include a stage. The stage may support, during use, a digital imaging device. In some embodiments, the system may include a calibration feature. The calibration feature may be of known dimension. The calibration feature may be coupled to the stage. The calibration feature may facilitate assessment, during use, of a dimension of the drop. The dimension may include a diameter of the drop. In some embodiments, the system is configured to assess a contact angle of the drop with the surface.


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