The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Jun. 04, 2013
Applicant:

Foss Analytical, Hilleroed, DK;

Inventor:

Per Waaben Hansen, Kgs. Lyngby, DK;

Assignee:

Foss Analytical A/S, Hilleroed, DK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/27 (2006.01); G01J 3/02 (2006.01); G01J 3/42 (2006.01); G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
G01N 21/35 (2013.01); G01J 3/0291 (2013.01); G01J 3/42 (2013.01); G01J 3/45 (2013.01); G01N 21/274 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/061 (2013.01); G01N 2201/12746 (2013.01);
Abstract

A method of determining a pathlength deviation of a sample (), the method comprising: exposing the sample () to electromagnetic radiation at a plurality of wavenumbers, determining electromagnetic absorption in the sample () at the plurality of wavenumbers, determining a first wavenumber associated with a first absorption level of an absorption band and a second wavenumber associated with a second absorption level of the absorption band, wherein the second wavenumber is different from the first wavenumber, determining a difference between the first wavenumber and the second wavenumber, and determining the pathlength deviation based on the difference.


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