The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Aug. 12, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Im-ho Shin, Hwaseong-si, KR;

Eun-jeong Jang, Suwon-si, KR;

Chung-ung Kim, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01N 1/28 (2006.01); G01N 35/00 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/28 (2013.01); G01N 35/00069 (2013.01); G01N 35/00663 (2013.01); G01N 35/00732 (2013.01); B01L 3/545 (2013.01); G01N 2035/0091 (2013.01); G01N 2035/00108 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/00772 (2013.01); G01N 2035/00782 (2013.01); G01N 2035/00831 (2013.01);
Abstract

An in-vitro diagnostic apparatus includes a loading unit which receives a test medium including a test object; a first clock including first time information that is set as a standard clock time and used to determine whether an expiration date of the test medium has passed; a second clock including second time information that can be set as an arbitrary time; a sensor which acquires the expiration date of the test medium; a controller which determines whether the expiration date of the test medium has passed, based on the first time information; and an analyzer which analyzes the test object based on the second time information when it is determined that the expiration date of the test medium has not yet passed.


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