The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2018
Filed:
Dec. 10, 2014
Applicant:
Dr. Johannes Heidenhain Gmbh, Traunreut, DE;
Inventor:
Wolfgang Holzapfel, Obing, DE;
Assignee:
DR. JOHANNES HEIDENHAIN GMBH, Traunreut, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/36 (2006.01); G01B 11/14 (2006.01); G01D 5/26 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01D 5/36 (2013.01); G01D 5/268 (2013.01);
Abstract
A position-measuring system includes a plurality of scanning units for the optical scanning of at least one measuring standard, the scanning units being coupled optically to a plurality of light sources and a plurality of detectors. Disposed between the scanning units and the detectors are a plurality of demultiplexers, via which in each case at least two scanning units are coupled to one detector.
Holzapfel, Wolfgang. (2018). Position-measuring system, having scanning units multiplexed to light sources and detectors, for optically scanning a measuring standard and method for operating such a position-measuring system (U.S. Patent No. 9874434). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9874434
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile