The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2018

Filed:

Sep. 18, 2009
Applicants:

Phillip Lucas Jay, Spring, TX (US);

Gary James Frisch, Houston, TX (US);

Inventors:

Phillip Lucas Jay, Spring, TX (US);

Gary James Frisch, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/40 (2006.01); G01V 3/18 (2006.01); G01V 5/04 (2006.01); G01V 9/00 (2006.01); E21B 47/06 (2012.01); G01K 1/02 (2006.01);
U.S. Cl.
CPC ...
E21B 47/065 (2013.01); G01K 1/026 (2013.01); G01K 2213/00 (2013.01);
Abstract

An apparatus includes a tool configured to operate within a borehole during a period wherein matter is being output from a surrounding earth formation into a flow of matter in the borehole. The tool includes a main tool body having a longitudinal axis. A temperature probe array is coupled to the main tool body, including a first temperature probe and a second temperature probe. The first temperature probe is radially spaced from and is at a different circumferential position relative to the second temperature probe during operation. The first temperature probe and the second temperature probe are configured to measure a first temperature and a second temperature, respectively, during operation, wherein at least one of a type of matter in the flow and an entry point of the matter from the surrounding earth formation is derived using the first temperature and the second temperature.


Find Patent Forward Citations

Loading…