The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Mar. 21, 2016
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Kimitaka Arai, Yokohama, JP;
Hideki Kubo, Kawasaki, JP;
Assignee:
Canon Kabuhshiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 1/50 (2006.01); H04N 1/54 (2006.01); B41J 2/21 (2006.01); B41M 3/00 (2006.01); B41M 3/06 (2006.01);
U.S. Cl.
CPC ...
H04N 1/50 (2013.01); B41J 2/2114 (2013.01); H04N 1/54 (2013.01); B41M 3/003 (2013.01); B41M 3/06 (2013.01);
Abstract
Provided is an image forming apparatus that forms a layer of at least one type of scattering material. The image forming apparatus is configured to obtain subsurface scattering characteristic data indicating the subsurface scattering characteristic of a reproducing target, and determine the laminated structure of the layer of the scattering material based on the subsurface scattering characteristic data. The image forming apparatus is configured to then form an image corresponding to the layer of the scattering material based on the determined laminated structure of the layer of the scattering material.