The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Apr. 27, 2017
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventors:

Jen-Huan Tsai, Hsinchu, TW;

Chih-Hong Lou, Yilan County, TW;

Assignee:

MEDIATEK INC., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 3/00 (2006.01); H03M 1/12 (2006.01); H03M 1/46 (2006.01);
U.S. Cl.
CPC ...
H03M 3/426 (2013.01); H03M 1/1245 (2013.01); H03M 1/466 (2013.01); H03M 3/424 (2013.01);
Abstract

An exemplary quantizer includes a multi-bit analog-to-digital converter (ADC) and a first digital-to-analog converter (DAC) feedback circuit. The multi-bit ADC has an internal DAC associated with comparison of each sampled analog input of the multi-bit ADC. The multi-bit ADC converts a currently-sampled analog input into a first digital output. A first noise-shaped truncation output is derived from the first digital output. The first DAC feedback circuit transfers a first truncation residue associated with the first noise-shaped truncation output to the internal DAC. The transferred first truncation residue is reflected in comparison of a later-sampled analog input of the multi-bit ADC via the internal DAC.


Find Patent Forward Citations

Tsai, Jen-Huan. (2018). Analog-to-digital converter with embedded noise-shaped truncation, embedded noise-shaped segmentation and/or embedded excess loop delay compensation (U.S. Patent No. 9871534). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9871534

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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