The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Nov. 15, 2016
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Masayasu Nagoshi, Kawasaki, JP;

Shinsuke Ide, Ames, IA (US);

Shin Ishikawa, Chiba, JP;

Noriko Makiishi, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 8/021 (2016.01); C22C 38/18 (2006.01); C22C 38/50 (2006.01); C21D 6/00 (2006.01); C21D 8/02 (2006.01); C22C 38/00 (2006.01); C22C 38/02 (2006.01); C22C 38/04 (2006.01); C22C 38/06 (2006.01); C22C 38/42 (2006.01); C22C 38/44 (2006.01); C22C 38/48 (2006.01); G01R 27/20 (2006.01); H01M 8/0254 (2016.01); H01M 8/0265 (2016.01); H01M 8/1018 (2016.01);
U.S. Cl.
CPC ...
H01M 8/021 (2013.01); C21D 6/004 (2013.01); C21D 8/0278 (2013.01); C22C 38/001 (2013.01); C22C 38/002 (2013.01); C22C 38/02 (2013.01); C22C 38/04 (2013.01); C22C 38/06 (2013.01); C22C 38/18 (2013.01); C22C 38/42 (2013.01); C22C 38/44 (2013.01); C22C 38/48 (2013.01); C22C 38/50 (2013.01); G01R 27/205 (2013.01); H01M 8/0254 (2013.01); H01M 8/0265 (2013.01); H01M 2008/1095 (2013.01); Y02E 60/50 (2013.01);
Abstract

A stainless steel having a low surface contact resistance for fuel cell separators is provided. The stainless steel has a Cr content of 16 to 40 mass % or more. The stainless steel includes a region having a fine textured structure on its surface, and the area percentage of the region is 50% or more, preferably 80% or more. The region having a fine textured structure is a region which has a structure having depressed portions and raised portions at an average interval between depressed portions or raised portions of 20 nm or more and 150 nm or less when observed with a scanning electron microscope.


Find Patent Forward Citations

Loading…