The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Jan. 24, 2017
Applicant:
1st Detect Corporation, Webster, TX (US);
Inventors:
David Rafferty, Webster, TX (US);
Louis Johnson, Pasadena, TX (US);
Assignee:
1st Detect Corporation, Webster, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); H01J 49/28 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/424 (2013.01); H01J 49/426 (2013.01);
Abstract
Apparatuses, systems, and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device for use in a mass analysis system. The ion trap device may comprise an ion trap and a signal generator for applying an excitation signal to the ion trap. The signal generator may include a plurality of oscillators each configured to selectively generate a corresponding sinusoid signal to be selectively combined to form the excitation signal.