The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Oct. 31, 2014
Applicant:

Dh Technologies Development Pte Ltd., Singapore, SG;

Inventors:

Thomas R Covey, Richmond Hill, CA;

Peter Kovarik, Markham, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/16 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
H01J 49/045 (2013.01); G01N 30/724 (2013.01); H01J 49/044 (2013.01); H01J 49/0404 (2013.01); H01J 49/167 (2013.01); G01N 30/7246 (2013.01); G01N 30/7273 (2013.01);
Abstract

Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the systems and methods can provide efficient cooling of an ion source probe to prevent overheating and the resulting degradation in ion sampling. In some aspects, such cooling can result in improved consistency and/or efficiency of ion formation. Moreover, ion source cooling in accordance with various aspects of the present teachings can allow for the use of higher temperatures in the ionization chamber (thereby improving desolvation) and/or can enable the use of lower flow rate sample sources than with conventional techniques.


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