The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Jul. 08, 2013
Applicant:

Teradata Us, Inc, Dayton, OH (US);

Inventors:

Sung Jin Kim, Buena Park, CA (US);

Rama Krishna Korlapati, El Segundo, CA (US);

Assignee:

Teradata US, Inc., Dayton, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01);
Abstract

A database system may include a storage device configured to store a plurality of database tables. The database system may further include a processor in communication with the storage device. The processor may determine a first sampling percentage to be used on a column of a database table. The first sampling percentage may be based on a respective frequency of each column value in the column. The processor may determine a second sampling percentage to be used on the column in generation of the plan to respond to the database query. The second sampling percentage may be based on size of the database table. The processor may select the maximum of the first sampling percentage and the second sampling percentage. The selected sampling percentage may be used to collect statistics on the column. The collected statistics may be used to generate at least one database query response plan associated with the column. A method and computer-readable medium may also be implemented.


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