The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Apr. 14, 2015
Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;
Teruhisa Tsuru, Nagaokakyo, JP;
MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;
Abstract
A product inspection device that includes a measuring section, a deemed standard deviation calculation unit, a measurement value standard deviation calculation unit, a determination unit, and a risk calculation unit. The measuring section measures characteristic values of products, the deemed standard deviation calculation unit calculates a deemed standard deviation, and the risk calculation unit calculates a consumer risk and a producer risk based on at least one of an average value of the measured characteristic values of some of the products contained in a measured product lot, the deemed standard deviation, or the measurement value standard deviation. The determination unit changes a inspection standard based on at least one of the calculated consumer risk or the calculated producer risk, and determines whether or not all the products contained in the product lot are non-defective articles with the changed inspection standard as a reference.