The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Jan. 15, 2016
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventor:

Mihai Bulea, Santa Clara, CA (US);

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0418 (2013.01); G06F 3/044 (2013.01);
Abstract

The embodiments described herein provide devices and methods that facilitate improved input device performance. Specifically, the devices and methods provide improved resistance to the effect of interference on input devices, and in particular, to the effect of unison noise on proximity sensors that use capacitive techniques to generate images of sensor values. The devices and methods provide improved resistance to the effects of interface by using images of sensor values and one or more profiles of sensor values. An image of sensor values is combined with one or more profiles of sensor values to produce a modified image of sensor values, the modified image having reduced errors due to noise. This reduction in errors due to noise can improve the accuracy and performance of the input device.


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