The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Jan. 04, 2016
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Eun Young Chang, Daejeon, KR;

Soo Hyun Lee, Daejeon, KR;

Jin Woong Kim, Daejeon, KR;

Tae One Kim, Daejeon, KR;

Kyung Ae Moon, Daejeon, KR;

Joong Ki Park, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 1/22 (2006.01); G03H 1/08 (2006.01); G03H 1/02 (2006.01);
U.S. Cl.
CPC ...
G03H 1/2294 (2013.01); G03H 1/0808 (2013.01); G03H 2001/0224 (2013.01); G03H 2001/2236 (2013.01); G03H 2001/2239 (2013.01); G03H 2210/30 (2013.01); G03H 2225/60 (2013.01);
Abstract

Provided is a hologram generation method including receiving three-dimensional (3D) data information, determining a first projection position onto which the 3D data information is projected on a hologram plane corresponding to a first spatial light modulator (SLM), and a second projection position onto which the 3D data information is projected on a hologram plane corresponding to a second SLM, generating a first Fresnel zone plate (FZP) pattern corresponding to the first projection position, and determining the first FZP pattern to be an FZP pattern corresponding to the second projection position.


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