The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

May. 13, 2013
Applicant:

Rolic Ag, Zug, CH;

Inventors:

Klaus Schmitt, Lorrach, DE;

Hubert Seiberle, Weil am Rhein, DE;

Assignee:

ROLIC AG, Zug, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/72 (2006.01); G03F 7/20 (2006.01); G02B 5/30 (2006.01); G02B 27/28 (2006.01); B29D 11/00 (2006.01); B42D 25/364 (2014.01); G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70191 (2013.01); B29D 11/00644 (2013.01); B42D 25/364 (2014.10); G02B 5/3025 (2013.01); G02B 5/3083 (2013.01); G02B 27/286 (2013.01); G02F 1/1303 (2013.01); G02F 2203/12 (2013.01);
Abstract

The present invention relates to an apparatus which allows producing elements with individually patterned anisotropic properties, where the pattern may vary from element to element. An apparatus according to the invention comprises a support for a substrate and an exposure unit for providing spatially modulated aligning light with a first polarization plane, wherein the exposure unit contains a light source, a spatial light modulator, which can be controlled electronically, for example by a computer, and a projection lens. The present invention furthermore relates to a method for fast production of elements with individually patterned anisotropic properties using such an apparatus.


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