The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
May. 18, 2015
Sharp Kabushiki Kaisha, Sakai, Osaka, JP;
SHARP KABUSHIKI KAISHA, Sakai, Osaka, JP;
Abstract
Inside of a region for inspection set outside a display region of an active matrix substrate, lead-out lines (to) connected to data lines pass through in a column direction, and a control line for inspection () and six signal lines for inspection (to) extend in a row direction. TFTs for inspection (to) control a conduction state between the lead-out line and the corresponding signal line for inspection in accordance with a signal on the control line for inspection. Inside the region for inspection, three of the six signal lines for inspection are arranged on one side of the control line for inspection, and the remaining three are arranged on other side of the control line for inspection. One of the two adjacent lead-out lines is connected to one of the former signal lines for inspection via the TFT for inspection (), and the other is connected to one of the latter signal lines for inspection via the TFT for inspection (). This suppresses a disconnection, a leakage current, and a luminance unevenness of a screen for inspection.