The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2018
Filed:
Jan. 13, 2016
Thorlabs, Inc., Newton, NJ (US);
Alex Cable, Newton, NJ (US);
Jörn Wollenzin, Lübeck, DE;
Ross Johnstone, Oak Hill, VA (US);
Kirk Gossage, Austin, TX (US);
Jeffrey S. Brooker, Oak Hill, VA (US);
Jason Mills, Austin, TX (US);
James Jiang, Hackettstown, NJ (US);
Dierck Hillmann, Lübeck, DE;
THORLABS, INC., Newton, NJ (US);
Abstract
Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.