The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Oct. 31, 2014
Applicant:

The Research Foundation for the State University of New York, Albany, NY (US);

Inventors:

Kenneth A. Halvorsen, Glenmont, NY (US);

Tony P. Hoang, Albany, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 11/00 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0004 (2013.01); G01N 11/00 (2013.01); G01N 15/1436 (2013.01);
Abstract

A centrifuge force microscope module for use within a bucket of a centrifuge in measuring a characteristic of a sample under a centrifugal force and/or in monitoring a sample under a centrifugal force. The centrifuge force microscope module includes an electronics module and an optical module. The electronics module includes a housing removably disposable in the bucket of the centrifuge, and at least one of a power source and a connector operably connectable to a power source for powering the electronics module. The optical module is operable to receive and direct light from the sample. The optical module is releaseably connectable to the housing of the electronics module.


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