The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Sep. 08, 2015
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Shengwen Jin, Sugar Land, TX (US);

Shiyong Xu, Sugar Land, TX (US);

Fan Xia, Katy, TX (US);

Richard Ottolini, Denver, CO (US);

Yiqing Ren, Sugar Land, TX (US);

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/38 (2006.01);
U.S. Cl.
CPC ...
G01V 1/303 (2013.01); G01V 1/38 (2013.01);
Abstract

An example method for tomographic migration velocity analysis may include collecting seismographic traces from a subterranean formation and using an initial velocity model to generate common image gathers and a depth image volume based, at least in part, on the seismographic traces. A structure tensor may be computed with the depth image volume for automated structural dip and azimuth estimation. A semblance may be generated using said plurality of common image gathers and said structure tensor. Image depth residuals may be automatically picked from said semblance. A ray tracing computation may be performed on said initial velocity models using said structure tensor. An updated velocity model may be generated with a tomographic inversion computation, wherein said tomographic inversion computation uses said plurality of image depth residuals and said ray tracing computation.


Find Patent Forward Citations

Loading…